Home > Products > IEC & UL Accessibility Probes > Test Finger Probe B Iec Test Finger
Test Finger Probe B Iec Test Finger
- 1000 Piece / Pieces per Month
- Shenzhen
- Credit Card
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- UL507 & UL Standard Articulated Finger Probe
- Safety Probe 12 Probe 13 Iec61032 Standard Test Probe Pin
Product Details
Place of Origin: | Guangdong, China | Brand Name: | CX | Model Number: | CX-2B |
Packaging Details
Bubble bag or silver box for selection
Product Description
Iec61032 Iec60065 Ip2x Test Finger Probe B Iec Test Finger
Application:
1, The joint part of The Standard Test Knurled Finger Probe can't touch the live parts or close to the dangerous parts, and 50 mm to 20 mm baffle plate cannot enter.
2, In the prevent electric shock test, wires , power devices, and lighting devices are needed.
3, Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance
1. Articulated Test Finger (Figure 2 / Test Probe B / IEC 61032)
The Articulated Test Finger is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL. IEC 60335, IRAM 4220-1 and in most of the rules involved in the verification of accessibility to live parts.
2. Rígid Test Finger (Figure 7 / Test Probe 11 / IEC 61032)
Rigid Test Finger is a precision probe made according to Figure 7 (Fig. 7) of the IEC 61032 (Test probe 11) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL.
3.Test Finger Nail (Figure 7 / IEC 60335-1)
Test Finger Nail is a test device designed to simulate a human finger nail. Test Finger Nail is designed and manufactured according to Figure 7 of IEC 60335.
Company Profile
We are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.
If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc., industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.
We would appreciate your comments on the layout design, presentation or other aspects of our website.
Contact Us
- Shenzhen Chuangxin Instruments Co., Ltd.
- Contact namehong wu
- Phone86-0755-61577692
- AddressRm. 106, No. 11-13, Lane 12, Baolian New Village, Gongle Community, Xixiang St., Bao'an Dist.
- IEC 61032 Long Test Pin Probe 12 & Iec Test Pin 12
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- probe 13 Cone Test probe 13 test probes manufacture
- High Quality IEC61032 Short Test Probe 13
- 15mm length Test Pin Probe 13 comforms to IEC60529 , IEC60536
- IP Code Access Probes Of IEC61032
- Access probe IEC60529 test probe A
- IEC60950 IEC61032 IEC60884 IEC test finger probes A IPX Lab testing
- IP2X IEC61032 Jointed Finger Probe Test Probe B
- IEC 61032 Test Probe B Standard Jointed Test Finger
- IEC61032 IEC60065 IP2X Test Finger Probe B iec test finger
- IEC61032 Acccessibility Tester Probe Access Test Probe 12
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